Scanning Electron Microscope

Magnification up to 60,000× / 150,000× available
Optional CCD Camera for real-time stage internal viewing
Accelerating voltage: 5/10/15/20/30 kV, high image resolution
Resolution: 15 nm (30 kV, SE); 20 nm (30 kV, BSE)
Imaging modes: SE, BSE, Multi Detector (SE+BSE)
Auto functions: Startup, focus, brightness/contrast adjustment

説明
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Application: Desktop SEM microscope supports PCB failure analysis to detect delamination, circuit corrosion and micro structural abnormalities efficiently. (New Machine)

パラメータ	Specification
Magnification	60,000×/150,000× (optional)
Accelerating Voltage	5–30 kV (5/10/15/20/30 kV selectable)
Resolution	15 nm (30 kV, SE); 20 nm (30 kV, BSE)
Imaging	SE, BSE, Multi (SE+BSE)
Detector	SE / BSE
Vacuum	High / Low (reduces sample prep)
Options	EDS (elemental analysis), CCD camera (stage view)
Stage Control	Manual / Automatic
Auto Functions	Startup, Focus, Brightness/Contrast
Image Formats	BMP, JPEG, PNG, TIFF
Software	Image edit/save, length/area/angle measurement
On-image info	Mag, KV, detector, scale bar, date/time